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Research Article

Efficient BIST architecture for combinational and sequential faulty circuits

Ankita Tripathi

IJDACR Vol.4 No.4 (November 2015) ISSN 2319-4863 Open Access Peer Reviewed

Journal

International Journal of Digital Applications and Contemporary Research (IJDACR)

ISSN

2319-4863

Volume / Issue

Vol.4 · Issue 4

Published

November 2015

Access

Open Access

Licence

CC BY-NC-SA 4.0

Authors

Ankita Tripathi

Abstract

Very Large Scale Integration (VLSI) has made an extraordinary effect on the development of integrated circuit technology. It has not only decreased the dimension and the price but also improved the complexness of the circuits. There are, however, prospective issues which may slow down the efficient use and development of upcoming VLSI technology.

How to Cite

Ankita Tripathi (2015). Efficient BIST architecture for combinational and sequential faulty circuits. International Journal of Digital Applications and Contemporary Research (IJDACR), Vol.4, Issue 4. ISSN: 2319-4863.

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Article Info

Journal IJDACR
Volume Vol. 4
Issue No. 4
Month November
Year 2015
ISSN 2319-4863
Access Open Access

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